Download e-book for iPad: Advances in imaging and electron physics. Volume 183 by Peter W. Hawkes

By Peter W. Hawkes

ISBN-10: 0128002654

ISBN-13: 9780128002650

Advances in Imaging & Electron Physics merges long-running serials―Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The sequence beneficial properties prolonged articles at the physics of electron units (especially semiconductor devices), particle optics at low and high energies, microlithography, photo technological know-how and electronic snapshot processing, electromagnetic wave propagation, electron microscopy, and the computing equipment utilized in these kinds of domains.

  • Contributions from major specialists
  • Informs and updates on the entire most recent advancements within the field

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Extra info for Advances in imaging and electron physics. Volume 183

Sample text

Castell, M. , & Cole, J. S. (1995). Field-emission SEM imaging of compositional and doping layer semiconductor superlattices, Ultramicroscopy, 58, 104–113. , & El Gomati, M. M. (2006). Scanning Auger Electron Microscopy. Chichester, UK: Wiley. , Kaganovich, I. , Fisch, N. , & Smolyakov, V. (2011). Effect of secondary electron emission on electron cross-field current in E x B discharges. IEEE Transactions on Plasma Science, 39, 995–1006. Reimer, L. (1985). Scanning Electron Microscopy. Berlin: Springer Verlag.

However, at the theoretical level, the concept of wavelet transform was first elaborated by the argentine mathematician Alberto Calderon in 1960 to solve several complex problems of interpolation and intermediate spaces; in this way, he opened the door to describing function spaces and their approximation properties (Young 1993). These works fixed the wavelet domain in the framework of the Calderon-Zygmund theory (Calderon 1957). In the 1970s (continuous wavelet transform), the 1980s (discrete wavelet transform/DWT) and the 1990s (wavelet packet, lifting wavelet transform), many scientific works from mathematicians, physicists, and information and communication technologies (ICT) researchers explored the opportunities of wavelet construction with particular properties 44 Laurent Navarro et al.

S. (1995). Field-emission SEM imaging of compositional and doping layer semiconductor superlattices, Ultramicroscopy, 58, 104–113. , & El Gomati, M. M. (2006). Scanning Auger Electron Microscopy. Chichester, UK: Wiley. , Kaganovich, I. , Fisch, N. , & Smolyakov, V. (2011). Effect of secondary electron emission on electron cross-field current in E x B discharges. IEEE Transactions on Plasma Science, 39, 995–1006. Reimer, L. (1985). Scanning Electron Microscopy. Berlin: Springer Verlag. Ritchie, N.

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Advances in imaging and electron physics. Volume 183 by Peter W. Hawkes


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